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            Semiconductor Testing

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            Third generation semiconductor testing family
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            QT-4100 comprehensive test system

            Suitable for electrical parameter testing of MOSFET, SIC, IGBT, gallium nitride, diodes, transistors, thyristors, solid-state discharge tubes, three-terminal voltage regulators, optocouplers, etc. Provide a complete set of mature test solutions, fully sup



            Pressure limiting and current limiting

            High-precision Rdon test

            Modular functionality

            Multi-station data merge

            Type The test coverage is high, and the circuit works in a voltage-limiting and current-limiting state, effectively protecting the device under test.
            Advantages Fool-proof measurement: automatic self-test for voltage and current measurement, automatic alarm and shutdown when abnormal
            LOW RDON
            Quick self-test: no external load required, self-test completed in 2 minutes
            Third-party calibration: Calibrated using Agilent 34401A
            Built-in oscilloscope function
            Support data merging of multi-station equipment
            Main Features ? Relay 3ms;
            ? Voltage limiting and current limiting protection;
            ? Support extended EAS, LCR, thermal resistance, SW, TRR, QG;
            ? Form-filling programming;
            ? Support PAT function;
            ? Equipped with SECS/GEM standard interface




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