Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
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QT-4100 comprehensive test system
Suitable for electrical parameter testing of MOSFET, SIC, IGBT, gallium nitride, diodes, transistors, thyristors, solid-state discharge tubes, three-terminal voltage regulators, optocouplers, etc. Provide a complete set of mature test solutions, fully sup
Pressure limiting and current limiting |
High-precision Rdon test |
Modular functionality |
Multi-station data merge |
Type | The test coverage is high, and the circuit works in a voltage-limiting and current-limiting state, effectively protecting the device under test. |
Advantages |
Fool-proof measurement: automatic self-test for voltage and current measurement, automatic alarm and shutdown when abnormal LOW RDON Quick self-test: no external load required, self-test completed in 2 minutes Third-party calibration: Calibrated using Agilent 34401A Built-in oscilloscope function Support data merging of multi-station equipment |
Main Features |
? Relay 3ms; ? Voltage limiting and current limiting protection; ? Support extended EAS, LCR, thermal resistance, SW, TRR, QG; ? Form-filling programming; ? Support PAT function; ? Equipped with SECS/GEM standard interface |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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